Model
PANalytical X'Pert PRO MRD
Device specifications
- X-ray emitter tube with copper anticathode
- Euler's cradle - 4 circle goniometer
- Possibility of mounting a heating plate allowing to vary the temperature from 300 K to 1173 K
- Choice between three optics
- a mirror for phase analysis and grazing incidence analysis
- a polycapillary lens for the analysis of constraints and textures
- a single capillary for RX micro-diffraction analysis .
- X’celerator rapid detector or proportional gas detector (Xenon)
- Rear graphite monochromator (with proportional detector) allowing attenuation of X-ray fluorescence
Analysis software
- Phase identification software (X’pert HighScore)
- Residual stress analysis software (X’pert Stress)
- Texture analysis software (LaboTex 3.0)
- Rietveld method of structural refinement (FullProf)
- Reflectometry data analysis software (X’pert Reflectivity)