Diffractometer
- four circles diffractometer (Kappa geometry).
- a dual source (an IμS microsource with Cu / 50 W anticathode and a IμS microsource with Mo / 50 W anticathode).
The two X-ray sources make it possible to adapt the measurements to the type of sample analyzed: the Cu source allows the determination of structures for micro-crystals (a few tens of microns) and ensures optimal absolute configuration determinations for chiral organic compounds, the Mo source being suitable for highly absorbent compounds.
- a Photon 100 detector with CMOS sensor.
- a low-temperature measurement device: N-Helix from Oxford Cryosystems allowing measurements in a temperature range from 28K to 300K from nitrogen in the air (generator of nitrogen) and bottled helium gas.
Purchase date: September 2014